INITIAL E-INFRASTRUCTURE FOR METROLOGY

Authors

  • SH.Masharipov Author
  • B.G‘aibnazarov Author
  • M.Qurbanbayev Author

Keywords:

Keywords: Digital calibration certificate (DCC), Digital metrology, Metrological e-infrastructure, Digital signature

Abstract

Annotation: The digital transformation of the economy is the result of profound changes in science, technology and society. The response to these changes should be the latest version of the SI and the corresponding development of the new measurement standards. In this regard, an important issue for metrology is to eliminate barriers towards digital transformation. Digitization of metrological data is becoming especially relevant. In solving this problem, the development of the metrological e-infrastructure plays an important role. The paper is dedicated to the presentation and generalization of the results and the problem of creating an e-infrastructure. Based on the analysis performed a preliminary scheme for the e-infrastructure implementation in NMI has been presented. In particular, one of the most important issues of digital transformation – the implementation of DCC – is also associated with the development of e-infrastructure.

References

BIPM, Worldwide metrology: What is metrology? https://www.bipm.org/en/worldwide-metrology/#metrology (assessed 07.20).

P. Howarth, F. Redgrave, Metrology in Short, 3rd Edn (Braunschweig, Germany: EURAMET), 2008.

Mohr P.J., Newell D.B., Taylor B.N. CODATA recommended values of the fundamental physical constants: 2014. J. Phys. Chem. Ref. Data. 2016;45(4):043102. doi: 10.1063/1.4954402. [PMC free article] [PubMed] [CrossRef] [Google Scholar]

BIPM, Quality Infrastructure (QI): Definition, https://www.bipm.org/utils/common/pdf/QI-definition.pdf (assessed 07.20).

R.J.C. Brown, The importance of the measurement infrastructure in economic recovery (Teddington UK: NPL), 2020, https://www.npl.co.uk/getattachment/about-us/Who-we-work-with/Government/NPL-evidence-and-analysis/Importance-of-the-measurement-infrastructure-Final.pdf (assessed 07.20).

Grochau H., ten Caten C.S., de Camargo Forte M.M. Motivations, benefits and challenges on ISO/IEC 17025 accreditation of higher education institution laboratories. Accred. Qual. Assur. 2018;23:183–188. [Google Scholar]

Kunzmann H., Pfeifer T., Schmitt R., Schwenke H., Weckenmann A. Productive metrology – adding value to manufacture. CIRP Ann. 2005;54:155–168. [Google Scholar]

Published

2024-09-25

How to Cite

SH.Masharipov, B.G‘aibnazarov, & M.Qurbanbayev. (2024). INITIAL E-INFRASTRUCTURE FOR METROLOGY. ОБРАЗОВАНИЕ НАУКА И ИННОВАЦИОННЫЕ ИДЕИ В МИРЕ, 51(2), 9-16. https://modernedu-dv.com/index.php/obr/article/view/793